ADVANTEST CORP

Advantest Corporation, together with its subsidiaries, manufactures and sells semiconductors, component test systems, and mechatronics-related products in Japan, rest of Asia, the Americas, and Europe. The company offers automated test equipment, including system on chip, power device, and memory test systems, as well as burn-in and SSD test systems; and metrology and SEM tools. It also provides component test systems, such as die level, SoC, and memory test handlers, as well as change kits, and pressure sensor stimulus; device interface for memory; test cell and automation solutions; system level test systems; device certification test systems; semiconductor failure analysis systems; and interconnect solutions, including test interface boards, substrates, test sockets, and thermal control units. In addition, the company offers cloud solutions comprising digital twin software, real-time data infrastructure, dynamic parametric test, and test engineering; and SiConic offerings, such as tackling modern silicon validation challenges, applications from bring-up to sign-off, explorer, link, empower test engineers within unified environment, and scalable ecosystem. Further, it provides system level testing for products, maintenance and support, consumables and used products sales, equipment leasing, and research and development services; consulting and solution services, including engineering, production ramp, production solution, and remote support; customer service agreement and uptime support services; and online customer training. The company was formerly known as Takeda Riken Kogyo Co., Ltd. and changed its name to Advantest Corporation in October 1985. Advantest Corporation was incorporated in 1946 and is headquartered in Chiyoda, Japan.

Advantest Corporation은 자회사들과 함께 일본, 아시아 기타 지역, 미주, 유럽에서 반도체, 부품 테스트 시스템, 메카트로닉스 관련 제품을 제조 및 판매합니다. 동사는 시스템 온 칩, 전력 소자, 메모리 테스트 시스템을 포함한 자동 테스트 장비와 번인 및 SSD 테스트 시스템, 그리고 계측 및 SEM 도구를 제공합니다. 또한 동사는 다이 레벨, SoC, 메모리 테스트 핸들러와 같은 부품 테스트 시스템을 비롯하여 체인지 키트, 압력 센서 자극 장치, 메모리용 디바이스 인터페이스, 테스트 셀 및 자동화 솔루션, 시스템 레벨 테스트 시스템, 디바이스 인증 테스트 시스템, 반도체 불량 분석 시스템